• Home > 
• ADE Products >
• Capacitive sensor products >

MicroSense II

5300 Console

• Microsense II High Precision Capacitance Gaging Console

 

Product Highlights:

• Non-contact displacement gage
• Ultra-high bandwidth (100 kHz)
• Sub-nanometer resolution
• Bearing and spindle analysis
• Run-out / NRRO motor or disk analysis
• Vibration, velocity, acceleration, flutter, and warp analysis
• Non-destructive testing

Description

The Microsense II is designed for high precision, non-contact measurement of high speed, moving, rotating, or vibrating devices utilizing ADE’s latest nanometer resolution capacitance technology. The advanced Microsense II is designed to meet the most demanding measurement needs including fast tool servo, ultra-high speed spindle analysis and hard disk drive AEM analysis.

The Microsense II can be configured with up to 4 simultaneous channels. A single channel allows for simple displacement and run-out gaging. A second channel can be added for simultaneous measurement applications. Two additional channels can be plugged-in for complete versatility in testing.

Differential Analog outputs are available via a DB25 connector on the rear panel or via SMB connectors on the front of each channel for easy connection to oscilloscopes, spectrum analyzers, computer based A/D boards, or ADE's new 3700/fft Spindle Metrology System.

The Microsense II comes standard with an easy-to-read analog display module to assist in setting up the probes For high-speed digital data-acquisition, the unit can be connected to an off-the-shelf data acquisitions card. High Bandwidth and sub-nanometer resolution are combined in the Microsense II to make this advanced instrument the ideal choice for precision measurements of spindles, shafts, bearings, pumps, and other moving or vibrating targets.

• Inspection / Evaluation of High-Speed Ball, Hydrodynamic or Air Bearings
• Machine Tool Spindle Performance Evaluation / Monitoring
• High-Speed PCB Drilling Spindle Evaluation / Monitoring
• Precision Optics Processing Equipment Evaluation / Monitoring
• Run-out / NRRO Motor or Disk Analysis
• Vibration Analysis
• Velocity, Acceleration, Flutter and Warp Analysis
• Non-Contact, Non-Destructive Measurement Applications
• Computer Disk Edge Runout Applications
• Disk Drive Motor Testing

A Range of Standard and Custom Probes

ADE Technologies has developed a new family of capacitance sensors for the Microsense II system, Series 5000 probes (.pdf).

Microsense II Specifications

Performance

• Ranges:

  +/- 25 microns to +/- 500 microns full scale, depending on probe selection.

• Frequency Response:

  Jumper selectable filtering: 1 kHz, 5 kHz, 20 kHz, 100 kHz

• Linearity:

  Typically 0.1% of full-scale (see note 1)

• Resolution:

  1 nanometer rms @ 100 kHz bandwidth (see note 1)

Functions (Standard Unit)

• Meter:

  Zero meter reading indicates probe is at nominal standoff from measured target.

Option for differential measurements

• A+B:

  Sum of the A probe and the B probe displacement signals

• A-B:

  Difference of the A probe and the B probe displacement signals

Velocity / Acceleration Option

• A plug-in VA option is available for the Microsense II system. When configured with this VA option, Velocity and Acceleration measurements are derived for the probe selected on the channel switch. Filtering is provided by three-pole Bessel or Butterworth low-pass plug-in filters. The user selects the upper roll-off frequency (as defined by ANSI standards) over a range from 1-20 kHz.

Mechanical Parameters

• Dimensions:

  Width: 16.5 inches (42.31 cm)

  Height: 5.75 inches (14.74 cm)

  Depth: 13.0 inches (33.33 cm)

Power Requirements

• The 5300 System utilizes a power supply that will accept virtually any standard input voltage in the world. Please specify the proper IEC320 power cord for your region.

  Input Voltages: 100-240 V ac, externally switched

  Input Frequency: 50-60 Hz

EMC Certification

• The Microsense II Capacitance Gage has been tested and is in compliance with the requirements set forth in EMC Directives EN 55022, EN 50082-1, 89/336/EC, IEC 801-2, IEC 801-3, and IEC 801-4. Test Report Number: CE101195.

Notes

1. Parameters listed are typical when using a 2mm active sensor area and a range of +/- 50 microns. Specifications will vary depending upon range, standoff distance, and probe active sensor area. Resolution improves with larger sensor areas, reduced bandwidth and smaller ranges. Ideal Operating Temperature is 60-90° F (16-35° C). For specific resolution for your application, talk to your ADE Technologies' sales representative.

Manufactured under one or more of the following U.S. Patents:

3,706,919 | 3,775,678 | 3,805,150 | 3,990,005 | 4,918,376 | 5,557,267

Other Patents applied for. Foreign Patents may also apply. 

Applications for this product

Vibration analysis

Thickness measurement

Rotating spindles

Related products

Series 5000 Probes

MicroSense II 5800 Console

MicroSense II 5810 Console